Overview
Lecturer
Adrian Alexandru Tulbure
Seminar tutor
Paula Stoica
Type of course
Compulsory
Language of instruction
English, German
Erasmus language
English, German
Domain
Electronic engineering and telecommunications
Field of study
Applied Electronics
Form of education
Full-time
Form of instruction
Class / Seminary
Credit awarded by
Grade
Teaching methods
Theorie and practical experiments
Entry requirements
Analog and digital electronic circuits, Electronic components
Aims
Outline the principles and methods that constitute the testing of devices and equipment used in electronics
Qualitative and quantitative interpretation of the functioning of electronic circuits and identification of main test points
Identification of hardware and software solutions for the main problems of automated testing of equipments
Use of the criteria and methods of evaluation of the quality of production processes and service activities in the field of electronic engineering
Design of dedicated systems with simple architecture, including related programs
Course contents
1. General considerations regarding the testing process
2. Characterization of defects. Logical defects. Short circuit defects. Interrupt type defects.
3. Generation of deterministic test vectors (ATG) for combinational circuits
4. Generation of deterministic test vectors (ATG) for sequential circuits
5. Random Test Generation (RTG) Methods
6. Generators of pseudo-random sequences
7. Data compression methods
8. Design principles for testability
9. Structured design for testability
10. Testing standard 1149.1
11. Testing standard 1149.4
12. Other standards used in testing
13. Indirect testing method – IDDQ testing
14. Indirect testing method – thermal footprint testing
Learning outcomes
- to develop the students' ability to use the knowledge acquired in the cross-semester practice correctly;
- to operationalize them in software and hardware testing procedures.
- to apply manual testing methods and techniques, automatic for both classical physical circuits and for software program routines and sequences.
Assessment
50% examina, 25% laboratory work, 25% semester activity
Recommended reading
Elemente de testare pentru sisteme electronice.
D. Pitica
Ed. Albastra, cluj, 2001 · a
Digital systems testing and testable design
. Abramovici, M. Breuere, A. Friedman
Computer Science Press, USA, 1998 · b
Testarea echipamentelor electronice – îndrumar de laborator.
D.Pitica
Ed. Casa cartii de stiinta, cluj, 2001 · c
Electro-probleme
A.Tulbure
Aeternitas, Alba, 2015 · e
LV123/ LV124/LV148
VDA
VW standard, Germany, 2017 · f